Publications

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2003
J. Sijbers and den Dekker, A. J., Mapping a polyhedron onto a sphere: application to Fourier descriptors, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
A. J. den Dekker and Sijbers, J., Maximum Likelihood estimation of signal amplitude and noise variance, in 13th IFAC Symposium on System Identification (SYSID-2003), Rotterdam, The Netherlands, 2003, pp. 126-131.
1999
J. Sijbers, den Dekker, A. J., Verhoye, M., Van Der Linden, A., and Van Dyck, D., Adaptive anisotropic noise filtering for magnitude MR data, in Proceedings of SPIE Medical Imaging, San Diego, USA, 1999, vol. 3661, pp. 1418-1425.
J. Sijbers, den Dekker, A. J., Verhoye, M., Van Der Linden, A., and Van Dyck, D., Adaptive anisotropic noise filtering for magnitude MR data, Magnetic Resonance Imaging, vol. 17, pp. 1533-1539, 1999.PDF icon Download full paper (366 KB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., How to optimize the design of a quantitative HREM experiment so as to attain the highest precision, Journal of Microscopy, vol. 194, pp. 95-104, 1999.PDF icon Download full paper (601.48 KB)
E. Bettens, Van Dyck, D., den Dekker, A. J., Sijbers, J., and van den Bos, A., Model-based two-object resolution from observations having counting statistics, Ultramicroscopy, vol. 77, pp. 37-48, 1999.PDF icon Download full paper (226 KB)
J. Sijbers, den Dekker, A. J., Raman, E., and Van Dyck, D., Parameter estimation from magnitude MR images, International Journal of Imaging Systems and Technology, vol. 10, pp. 109-114, 1999.PDF icon Download paper (350.44 KB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., Quantitative HREM: viewpoints on resolution, precision, and experimental design, in Acta Cryst. A55 Supplement, Abstract M11.OE.OO5, IUCR Glasgow, Scotland, 1999.
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., van den Bos, A., den Dekker, A. J., Jansen, J., and Zandbergen, H., Towards quantitative structure determination through electron holographic methods, Materials Characterization, vol. 42, pp. 265-281, 1999.PDF icon Download full paper (6.72 MB)
1998
D. Van Dyck, den Dekker, A. J., Sijbers, J., and Bettens, E., Dose Limited Resolution, in Proceedings Microscopy and Microanalysis, Atlanta, Georgia, U.S.A, 1998, vol. 2, pp. 802-803.
J. Sijbers, den Dekker, A. J., Van Dyck, D., and Raman, E., Estimation of signal and noise from Rician distributed data, in Proceedings of the IASTED International Conference on Signal Processing and Communications, Canary Islands, Spain, 1998, pp. 140-143.
J. Sijbers, den Dekker, A. J., Van Audekerke, J., Verhoye, M., and Van Dyck, D., Estimation of the noise in magnitude MR images, Magnetic Resonance Imaging, vol. 16, pp. 87-90, 1998.PDF icon Download paper (64.9 KB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., How to design an HREM experiment so as to attain the highest precision?, in ICEM14: 14th International Congress on Electron Microscopy, Cancun, Mexico, 1998, vol. 1, pp. 621-622.
J. Sijbers, den Dekker, A. J., Scheunders, P., and Van Dyck, D., Maximum Likelihood estimation of Rician distribution parameters, IEEE Transactions on Medical Imaging, vol. 17, pp. 357-361, 1998.PDF icon Download paper (106.26 KB)
A. J. den Dekker, Sijbers, J., Verhoye, M., and Van Dyck, D., Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images, in Proceedings of SPIE Medical Imaging, San Diego, California, USA, 1998, vol. 3338, pp. 408-415.
J. Sijbers, den Dekker, A. J., Verhoye, M., and Van Dyck, D., Optimal estimation of T2 maps from magnitude MR data, in Proceedings of SPIE Medical Imaging, San Diego, CA, USA, 1998, vol. 3338, pp. 384-390.PDF icon Download paper (1.04 MB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., Optimizing the design of an HREM experiment so as to attain the highest resolution, in Proceedings of FEMMS98: Frontiers of Electron Microscopy in Material Science, Kloster Irsee, Germany, 1998.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory, in Workshop: Towards Atomic Resolution Analysis 98, Port Ludlow, WA, U.S.A, 1998.
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., Ultimate resolution in the framework of parameter estimation, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.
1997
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., den Dekker, A. J., and van den Bos, A., From High Resolution Image to Atomic Structure: how fare are we?, Scanning Microscopy, Special Issue on Image Processing, vol. 11, pp. 467-478, 1997.PDF icon Download full paper (3.45 MB)
A. J. den Dekker and van den Bos, A., Resolution: a survey, J. Opt. Soc. Am. A, vol. 14, pp. 547–557, 1997.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., Resolving atoms: what do we have? what do we want?, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
J. Sijbers, den Dekker, A. J., Scheunders, P., Raman, E., and Van Dyck, D., Unbiased signal estimation in magnitude MR images, in Proceedings of the European Society for Magnetic Resonance in Medicine and Biology, Brussels, Belgium, 1997, vol. 2, p. 174.

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