Publications

Export 2 results:
[ Author(Desc)] Type Year
Filters: Author is Jan De Beenhouwer  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
D
J. De Beenhouwer, Palenstijn, W. J., Bleichrodt, F., Batenburg, K. J., and Sijbers, J., “A framework for markerless alignment with full 3D flexibility”, European Microscopy Conference. 2012.PDF icon Download abstract (117.9 KB)
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)