Publications

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Journal Article
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
A. Dabravolski, Batenburg, K. J., and Sijbers, J., A Multiresolution Approach to Discrete Tomography Using DART, PLoS ONE, vol. 9, no. 9, 2014.PDF icon Download paper (6.13 MB)
W. Van Aarle, Batenburg, K. J., and Sijbers, J., Optimal threshold selection for segmentation of dense homogeneous objects in tomographic reconstructions, IEEE Transactions on Medical Imaging, vol. 30, pp. 980-989, 2011.PDF icon Download paper (1.59 MB)
K. J. Batenburg and Sijbers, J., Optimal Threshold Selection for Tomogram Segmentation by Projection Distance Minimization, IEEE Transactions on Medical Imaging, vol. 28, pp. 676-686, 2009.PDF icon Download full paper (2.51 MB)
W. J. Palenstijn, Batenburg, K. J., and Sijbers, J., Performance improvements for iterative electron tomography reconstruction using graphics processing units (GPUs), Journal of structural biology, vol. 176, no. 2, pp. 250-253, 2011.PDF icon Download paper (527.21 KB)
G. Van Eyndhoven, Kurttepeli, M., Van Oers, C. J., Cool, P., Bals, S., Batenburg, K. J., and Sijbers, J., Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials, Ultramicroscopy, vol. 148, pp. 10-19, 2015.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., Quantitative 3D analysis of huge nanoparticle assemblies., Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., Quantitative 3D analysis of huge nanoparticle assemblies, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
S. Bals, Batenburg, K. J., Verbeeck, J., Sijbers, J., and Van Tendeloo, G., Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes, Nano Letters, vol. 7, pp. 3669-3674, 2007.
T. Roelandts, Batenburg, K. J., den Dekker, A. J., and Sijbers, J., The reconstructed residual error: A novel segmentation evaluation measure for reconstructed images in tomography, Computer Vision and Image Understanding, vol. 126, pp. 28-37, 2014.PDF icon Download paper (4.58 MB)
G. Van Gompel, Defrise, M., and Batenburg, K. J., Reconstruction of a uniform star object from interior x-ray data: uniqueness, stability and algorithm, Inverse Problems, vol. 25, 2009.
G. Van Eyndhoven, Batenburg, K. J., and Sijbers, J., Region-based iterative reconstruction of structurally changing objects in CT, IEEE Transactions on Image Processing, vol. 23, no. 2, pp. 909-919, 2014.
K. J. Batenburg, Van Aarle, W., and Sijbers, J., A Semi-Automatic Algorithm for Grey Level Estimation in Tomography, Pattern Recognition Letters, vol. 32, pp. 1395-1405, 2011.
W. Van Aarle, Batenburg, K. J., Van Gompel, G., Van de Casteele, E., and Sijbers, J., Super-resolution for computed tomography based on discrete tomography, IEEE Transactions on Image Processing, vol. 23, no. 3, pp. 1181 - 1193, 2014.PDF icon Download paper (2.24 MB)
K. Zarei Zefreh, Van Aarle, W., Batenburg, K. J., and Sijbers, J., Super-Resolution of License Plate Images using Algebraic Reconstruction Technique, Journal of Image and Graphics, vol. 1, no. 2, pp. 94 - 98, 2013.PDF icon Download paper (812.84 KB)
F. De Carlo, Gursoy, D., Ching, D., Batenburg, K. J., Ludwig, W., Mancini, L., Welford, F. M., Mokso, R., Pelt, D., Sijbers, J., and Rivers, M., TomoBank: A Tomographic Data Repository for Computational X-ray Science, Measurement Science and Technology, vol. 29, no. 3, pp. 1-10, 2018.PDF icon Download paper (5.71 MB)

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