Publications

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Conference Abstract
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM”, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.
Journal Article
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., “Advanced electron crystallography through model-based imaging”, IUCrJ, vol. 3, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question”, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy”, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., “Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?”, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., “Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images”, Applied Physics Letters, vol. 105, no. 063116, 2014.
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., “StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”, Ultramicroscopy, vol. 171, pp. 104–116, 2016.