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Presenti, A., J. Sijbers, A J. den Dekker, and J. De Beenhouwer, "CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images", 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019. PDF icon Download paper (219.28 KB)
Presenti, A., J. Sijbers, and J. De Beenhouwer, "Dynamic angle selection for few-view X-ray inspection of CAD based objects", 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), vol. 11072, 2019.
Presenti, A., S. Bazrafkan, J. Sijbers, and J. De Beenhouwer, "Deep learning-based 2D-3D sample pose estimation for X-ray 3DCT", 10th Conference on Industrial Computed Tomography (ICT 2020), 2020.