Publications

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Patent
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
Journal Article
M. Van Dael, Verboven, P., Dhaene, J., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Multisensor X-ray inspection of internal defects in horticultural products”, Postharvest Biology and Technology, vol. 128, pp. 33–43, 2017.
T. De Schryver, Dhaene, J., Dierick, M., Boone, M. N., Janssens, E., Sijbers, J., Van Dael, M., Verboven, P., Nicolai, B., and Van Hoorebeke, L., “In-line NDT with X-Ray CT combining sample rotation and translation”, NDT & E International, vol. 89, pp. 89–98, 2016.