Publications

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Journal Article
De Backer, A., K. H. W. van den Bos, W. Van den Broek, J. Sijbers, and S. Van Aert, "StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images", Ultramicroscopy, vol. 171, pp. 104–116, 2016.
Gonnissen, J., A. De Backer, A J. den Dekker, G. T. Martinez, A. Rosenauer, J. Sijbers, and S. Van Aert, "Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images", Applied Physics Letters, vol. 105, issue 063116, 2014.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
den Dekker, A J., J. Gonnissen, A. De Backer, J. Sijbers, and S. Van Aert, "Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?", Ultramicroscopy, vol. 134, pp. 34-43, 2013.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy", Ultramicroscopy, vol. 170, pp. 128-138, 2016.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question", Ultramicroscopy, vol. 147, pp. 112–120, 2017.
Van Aert, S., A. De Backer, G. T. Martinez, A J. den Dekker, D. Van Dyck, S. Bals, and G. Van Tendeloo, "Advanced electron crystallography through model-based imaging", IUCrJ, vol. 3, no. 1, Jan, 2016.