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2003
Sterckx, S., P. Coppin, S. De Backer, W. Debruyn, P. Kempeneers, K. Meuleman, K. Nackaerts, I. Reusen, and P. Scheunders, "Information extraction techniques for monitoring of stress symptoms in orchards", Proc. Earsel 2003, Imaging Spectroscopy workshop Oberpfaffenhofen, pp. 278-283, 2003.
Meuleman, K., P. Coppin, S. De Backer, W. Debruyn, K. Nackaerts, P. Scheunders, and S. Sterckx, "Optimal hyperspectral indicators for stress detection in orchards", Proc. Earsel 2003, Imaging Spectroscopy workshop Oberpfaffenhofen, pp. 534-541, 2003.