Publications

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Conference Paper
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “Optimizing the design of an HREM experiment so as to attain the highest resolution”, in Proceedings of FEMMS98: Frontiers of Electron Microscopy in Material Science, Kloster Irsee, Germany, 1998.
D. H. J. Poot, Sijbers, J., and den Dekker, A. J., “Optimizing the Diffusion Kurtosis imaging acquisition”, in European Society for Magnetic Resonance in Medicine and Biology, Valencia, Spain, 2008.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory”, in Workshop: Towards Atomic Resolution Analysis 98, Port Ludlow, WA, U.S.A, 1998.
G. Ramos-Llordén, Segers, H., Palenstijn, W. J., den Dekker, A. J., and Sijbers, J., “Partially discrete magnetic resonance tomography”, in 2015 IEEE International Conference on Image Processing (ICIP), 2015, pp. 1653-1657.
J. Sijbers and den Dekker, A. J., “The performance of generalized likelihood ratio tests for complex functional MRI data in the presence of phase model misspecification”, in European Society of Magnetic Resonance in Medicine (ESMRMB), Copenhagen, Denmark, 2004, p. 96.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “Quantitative HREM: viewpoints on resolution, precision, and experimental design”, in Acta Cryst. A55 Supplement, Abstract M11.OE.OO5, IUCR Glasgow, Scotland, 1999.
E. Ribeiro Sabidussi, Caan, M., Bazrafkan, S., den Dekker, A. J., Sijbers, J., Niessen, W. J., and Poot, D. H. J., “Recurrent Inference Machines as Inverse Problem Solvers for MR Relaxometry”, in MIDL 2021 - Medical Imaging with Deep Learning, 2021.
J. Sijbers, den Dekker, A. J., Poot, D. H. J., Bos, R., Verhoye, M., Van Camp, N., and Van Der Linden, A., “Robust estimation of the noise variance from background MR data”, in Proceedings of SPIE Medical Imaging: Image Processing, San Diego, CA, USA, 2006, vol. 6144, pp. 2018-2028.
G. Ramos-Llordén, den Dekker, A. J., Van Steenkiste, G., Van Audekerke, J., Verhoye, M., and Sijbers, J., “Simultaneous motion correction and T1 estimation in quantitative T1 mapping: An ML restoration approach”, in 2015 IEEE International Conference on Image Processing (ICIP), 2015, pp. 3160-3164.
D. Giraldo, Beirinckx, Q., den Dekker, A. J., Jeurissen, B., and Sijbers, J., “Super-resolution reconstruction of multi-slice T2-w FLAIR MRI improves Multiple Sclerosis lesion segmentation”, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Sydney, Australia, 2023.
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., “Ultimate resolution in the framework of parameter estimation”, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
J. Sijbers, den Dekker, A. J., Scheunders, P., Raman, E., and Van Dyck, D., “Unbiased signal estimation in magnitude MR images”, in Proceedings of the European Society for Magnetic Resonance in Medicine and Biology, Brussels, Belgium, 1997, vol. 2, p. 174.
Journal Article
J. Sijbers, den Dekker, A. J., Verhoye, M., Van Der Linden, A., and Van Dyck, D., “Adaptive anisotropic noise filtering for magnitude MR data”, Magnetic Resonance Imaging, vol. 17, pp. 1533-1539, 1999.PDF icon Download full paper (366 KB)
B. Shafieizargar, Jeurissen, B., Poot, D. H. J., Klein, S., Van Audekerke, J., Verhoye, M., den Dekker, A. J., and Sijbers, J., “ADEPT: Accurate Diffusion EPI with multi-contrast shoTs”, Magnetic Resonance in Medicine, vol. 89, no. 1, pp. 396-410, 2023.PDF icon Download paper (5.82 MB)
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., “Advanced electron crystallography through model-based imaging”, IUCrJ, vol. 3, 2016.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Atom column detection from simultaneously acquired ABF and ADF STEM images”, Ultramicroscopy, vol. 219, p. 113046, 2020.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question”, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Sijbers, Poot, D. H. J., den Dekker, A. J., and Pintjens, W., “Automatic estimation of the noise variance from the histogram of a magnetic resonance image”, Physics in Medicine and Biology, vol. 52, pp. 1335-1348, 2007.PDF icon Download paper (297.18 KB)
P. Bladt, den Dekker, A. J., Clement, P., Achten, E., and Sijbers, J., “The costs and benefits of estimating T1 of tissue alongside cerebral blood flow and arterial transit time in pseudo-continuous arterial spin labeling”, NMR in Biomedicine, vol. 33, no. 12, pp. 1-17, 2020.PDF icon Download paper (16.44 MB)
A. J. den Dekker and Sijbers, J., “Data distributions in magnetic resonance images: a review”, Physica Medica, vol. 30, no. 7, pp. 725–741, 2014.PDF icon Download paper (410.33 KB)PDF icon Download paper (protected) (505.58 KB)
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy”, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
Q. Collier, Veraart, J., Jeurissen, B., Vanhevel, F., Pullens, P., Parizel, P. M., den Dekker, A. J., and Sijbers, J., “Diffusion kurtosis imaging with free water elimination: a Bayesian estimation approach”, Magnetic Resonance in Medicine, vol. 80, no. 2, pp. 802-813, 2018.PDF icon Download paper (1.93 MB)
J. Sijbers, den Dekker, A. J., Van Audekerke, J., Verhoye, M., and Van Dyck, D., “Estimation of the noise in magnitude MR images”, Magnetic Resonance Imaging, vol. 16, pp. 87-90, 1998.PDF icon Download paper (64.9 KB)
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., “Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?”, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., den Dekker, A. J., and van den Bos, A., “From High Resolution Image to Atomic Structure: how fare are we?”, Scanning Microscopy, Special Issue on Image Processing, vol. 11, pp. 467-478, 1997.

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