Publications

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Journal Article
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox”, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Efficient iterative reconstruction with beam shape compensation for THz computed tomography”, Applied Optics, vol. 62, no. 17, pp. F31-F40, 2023.PDF icon Download paper (1.81 MB)
J. Sanctorum, Van Wassenbergh, S., Nguyen, V., De Beenhouwer, J., Sijbers, J., and Dirckx, J. J. J., “Extended imaging volume in cone-beam x-ray tomography using the weighted simultaneous iterative reconstruction technique”, Physics in Medicine and Biology, vol. 66, no. 16, 2021.PDF icon Download paper (4.28 MB)
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “Fast and accurate pose estimation of additive manufactured objects from few X-ray projections”, Expert Systems With Applications, vol. 213, no. 118866, pp. 1-10, 2023.
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., “Fast and Flexible X-ray Tomography Using the ASTRA Toolbox”, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)
E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast inline inspection by neural network based filtered backprojection: Application to apple inspection”, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.PDF icon Download paper (726.63 KB)
E. Janssens, Pelt, D., De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt”, Chemical Engineering Transactions, vol. 44, pp. 181-186, 2015.
B. Huyge, Sanctorum, J., Jeurissen, B., De Beenhouwer, J., and Sijbers, J., “Fiber Orientation Estimation from X-ray Dark Field Images of Fiber Reinforced Polymers using Constrained Spherical Deconvolution”, Polymers, vol. 15, no. 13, p. 2887, 2023.PDF icon Download paper (2.95 MB)
B. De Samber, Renders, J., Elberfeld, T., Maris, Y., Sanctorum, J., Six, N., Liang, Z., De Beenhouwer, J., and Sijbers, J., “FleXCT: a Flexible X-ray CT scanner with 10 degrees of freedom”, Optics Express, vol. 29, no. 3, pp. 3438-3457, 2021.PDF icon Download paper (14.25 MB)
N. Six, Renders, J., Sijbers, J., and De Beenhouwer, J., “Gauss-Newton-Krylov for Reconstruction of Polychromatic X-ray CT Images”, IEEE Transactions on Computational Imaging, vol. 7, pp. 1304-1313, 2021.
V. Nguyen, Sanctorum, J., Van Wassenbergh, S., Dirckx, J. J. J., Sijbers, J., and De Beenhouwer, J., “Geometry Calibration of a Modular Stereo Cone-Beam X-ray CT System”, Journal of Imaging, vol. 7, no. 54, pp. 1-12, 2021.PDF icon Download paper (4.2 MB)
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study”, Optics Express, vol. 31, no. 17, pp. 28051-28064, 2023.
J. Deng, Renders, J., Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Braeken, D., De Beenhouwer, J., and Sijbers, J., “Imaging Algorithm and Optimal Measurement Protocol for 3D Impedance Tomography on 2D High Density Micro Electrode Array”, IEEE Sensors, vol. 24, no. 15, pp. 24452-24465, 2024.
J. Renders, Jeurissen, B., Nguyen, A. - T., De Beenhouwer, J., and Sijbers, J., “ImWIP: open-source image warping toolbox with adjoints and derivatives”, SoftwareX, vol. 24, p. 101524, 2023.PDF icon Download paper (1 MB)
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
M. Ljubenović, Zhuang, L., De Beenhouwer, J., and Sijbers, J., “Joint Deblurring and Denoising of THz Time-Domain Images”, IEEE Access, vol. 9, pp. 162-176, 2021.PDF icon Download paper (2.38 MB)
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps”, Optics Express, vol. 32, no. 2, pp. 1135-1150, 2024.PDF icon Download paper (13.42 MB)
B. Auer, Kalluri, K., De Beenhouwer, J., Zeraatkar, N., Momsen, N., Kuo, P. H., Furenlid, L. R., and King, M. A., “Keel-Edge Height Selection for Improved Multi-Pinhole 123I Brain SPECT Imaging”, Journal of Nuclear Medicine, vol. 61, p. 573, 2020.PDF icon Download paper (127.73 KB)
V. Van Nieuwenhove, Van Eyndhoven, G., Batenburg, K. J., Buls, N., Vandemeulebroucke, J., De Beenhouwer, J., and Sijbers, J., “Local Attenuation Curve Optimization (LACO) framework for high quality perfusion maps in low-dose cerebral perfusion CT”, Medical Physics, vol. 43, no. 12, pp. 6429-6438, 2016.
V. Nguyen, De Beenhouwer, J., Sanctorum, J., Van Wassenbergh, S., Bazrafkan, S., Dirckx, J. J. J., and Sijbers, J., “A low-cost geometry calibration procedure for a modular cone-beam X-ray CT system”, Nondestructive Testing and Evaluation , vol. 35, no. 3, pp. 252-265, 2020.
B. G. Booth, Sijbers, J., and De Beenhouwer, J., “A Machine Learning Approach to Growth Direction Finding for Automated Planting of Bulbous Plants”, Scientific Reports, vol. 10, no. 661, 2020.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
E. Nazemi, Six, N., Iuso, D., De Samber, B., Sijbers, J., and De Beenhouwer, J., “Monte-Carlo-Based Estimation of the X-ray Energy Spectrum for CT Artifact Reduction”, Applied Sciences, vol. 11, no. 7, 2021.PDF icon Download paper (4.96 MB)
V. Van Nieuwenhove, De Beenhouwer, J., Vlassenbroeck, J., Brennan, M., and Sijbers, J., “MoVIT: A tomographic reconstruction framework for 4D-CT”, Optics Express, vol. 25, no. 16, pp. 19236-19250, 2017.
E. Janssens, De Beenhouwer, J., Van Dael, M., De Schryver, T., Van Hoorebeke, L., Verboven, P., Nicolai, B., and Sijbers, J., “Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection”, Measurement Science and Technology, vol. 29, no. 3, 2018.PDF icon Download paper (3.4 MB)

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