Publications

Export 2 results:
[ Author(Desc)] Type Year
Filters: Author is Jarmo Fatermans  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
F
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.