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E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A model-based correction method for beam hardening artefacts in X-ray microtomography, Journal of X-ray science and technology, vol. 12, pp. 53-57, 2004.PDF icon Download full paper (581.05 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., The effect of beam hardening on MTF measurements in X-ray microtomography, in 19th Annual Symposium of the Belgian Hospital Physicists Association, 2004.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., Effect of beam hardening on resolution in x-ray microtomography, in SPIE Medical Imaging: Image Processing, San Diego CA, USA, 2004, vol. 5370, pp. 2089-2096.PDF icon Download paper (156.85 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A model-based correction method for beam-hardening artifacts in X-ray tomography, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
E. Van de Casteele, Parizel, P. M., and Sijbers, J., Quantitative evaluation of ASiR image quality: an adaptive statistical iterative reconstruction technique, in SPIE Medical Imaging, 2012, vol. 8313.PDF icon Download abstract (453.01 KB)
T. Van De Looverbosch, Bhuiyan, H. Rahman, Verboven, P., Dierick, M., Van Loo, D., De Beenhouwer, J., Sijbers, J., and Nicolai, B., Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning, Food Control, vol. 113, no. 107170, pp. 1-13, 2020.
T. Van De Looverbosch, Raeymaekers, E., Verboven, P., Sijbers, J., and Nicolai, B., Non-destructive internal disorder detection of Conference pears by semantic segmentation of X-ray CT scans using deep learning, Expert Systems with Applications, vol. 176, no. 114925, pp. 1-12, 2021.
T. Van De Looverbosch, Jiaqi, H., Tempelaere, A., Kelchtermans, K., Verboven, P., Tuytelaars, T., Sijbers, J., and Nicolai, B., Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images, Computers and Electronics in Agriculture, vol. 197, no. 106962, pp. 1-14, 2022.
G. Van de Wouwer, Vautrot, P., Scheunders, P., Livens, S., Van Dyck, D., and Bonnet, N., Rotation-invariant texture segmentation using continuous wavelets, in Proc. 2-nd IEEE Symposium on applications of time-frequency and time-scale methods , Coventry, UK, 27-29/9, 1997.
G. Van de Wouwer, Scheunders, P., Livens, S., and Van Dyck, D., Wavelet correlation signatures for color texture characterization, pattern Recognition, vol. 32, pp. 443-451, 1999.
G. Van de Wouwer and Scheunders, P., Wavelet-based texture classification, Recent Research in the Development of Pattern Recognition, vol. 1, pp. 77-87, 2000.
G. Van de Wouwer, Scheunders, P., and Van Dyck, D., Statistical texture characterization from discrete wavelet representations, IEEE Transactions on Image Processing, vol. 8, pp. 592-598, 1999.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Wuyts, F. L., and Van de Heyning, P. H., Voice classification by wavelet transforms and fuzzy interpreted LVQ networks, in Proceedings International Symposium on Soft Computing and Intelligent Industrial Automation, Reading, UK, March 26-28, 1996, pp. 171-177.
G. Van de Wouwer, Weyn, B., Scheunders, P., Jacob, W., Van Marck, E., and Van Dyck, D., Automated chromatin-texture based diagnosis of carcinoma nuclei, Journal of Microscopy, vol. 197, pp. 25-35, 2000.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Wuyts, F. L., and Van de Heyning, P. H., Voice recognition from spectrograms: a wavelet based approach, Fractals, vol. 5, pp. 165-172, 1997.
G. Van de Wouwer, Livens, S., Scheunders, P., and Van Dyck, D., Color texture classification by wavelet energy-correlation signatures, in Proc. ICIAP Intern. Conf. On Computer Analysis and Image Processing , Florence, Italy, 17-19 september, 1997, pp. 327-334.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Bodt, D. M., Wuyts, F. L., and Van de Heyning, P. H., Wavelet-FILVQ classifier for speech analysis, in Proc. ICPR'96 Internat. Conference on Pattern Recognition , D, pp. 214-218, Vienna, august 25-30, 1996, pp. 214-218.
G. Van de Wouwer, Scheunders, P., and Van Dyck, D., Rotation-Invariant Texture Characterization using Isotropic Wavelet Frames, in Proc. ICPR98, International Conference on Pattern Recognition , Brisbane, Australia, 17-20 august, 1998, pp. 814-816.
W. Van den Broek, Verbeeck, J., Schryvers, D., De Backer, S., and Scheunders, P., Tomographic Spectroscopic Imaging; an experimental proof of concept, Ultramicroscopy, vol. 109, pp. 296-303, 2009.
W. Van den Broek, Verbeeck, J., De Backer, S., Scheunders, P., and Schryvers, D., Acquisition of the EELS data cube by tomographic reconstruction, Ultramicroscopy, vol. 106, pp. 269-276, 2006.
W. Van den Broek, Rosenauer, A., Sijbers, J., Van Dyck, D., and Van Aert, S., A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Ultramicroscopy, Ultramicroscopy, vol. 141, pp. 22–31, 2014.
S. Van der Jeught, Sijbers, J., and Dirckx, J. J. J., Fast Fourier-based phase unwrapping on the graphics processing unit in real-time imaging applications, Journal of Imaging, vol. 1, pp. 31-44, 2015.PDF icon Download paper (1.35 MB)
S. Van der Jeught, Optical techniques for real-time morphology measurement of the tympanic membrane, 2015.
A. Van Der Linden, Van de Casteele, E., Thomas, M. S., Vos, A., Janssen, E., and Janssens, K., Analysis of micro computed tomography images; a look inside historic enamelled metal objects, Applied Physics A, vol. 98, no. 2, pp. 385 - 392, 2010.
C. Van Dijck, Wirix-Speetjens, R., Huysmans, T., Danckaers, F., Sijbers, J., and Vander Sloten, J., Influence of Correspondence Method on Statistical Model Based Shape Prediction, Symposium on Statistical Shape Models and Applications, Delémont, Switzerland. 2014.

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