Publications

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2018
Van Aert, S., J. Fatermans, A. De Backer, K.. H. W. van den Bos, C. M. O'Leary, K. Müller-Caspary, L. Jones, I. Lobato, A. Béché, A J. den Dekker, et al., "Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials", IMC19, Sydney, Australia, 2018.
2016
Van Aert, S., A. De Backer, G. T. Martinez, A J. den Dekker, D. Van Dyck, S. Bals, and G. Van Tendeloo, "Advanced electron crystallography through model-based imaging", IUCrJ, vol. 3, no. 1, Jan, 2016.
Zanaga, D., T. Altantzis, J. Sanctorum, B. Freitag, and S. Bals, "An alternative approach for ζ-factor measurement using pure element nanoparticles", Ultramicroscopy, vol. 164, pp. 11–16, 2016.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, J. Sijbers, G. Van Tendeloo, et al., "Investigating lattice strain in Au nanodecahedrons", European Microscopy Congress 2016, 2016.
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. de Nijs, M. A. van Huis, A. Sánchez-Iglesias, L. M. Liz-Marzán, et al., "Quantitative 3D analysis of huge nanoparticle assemblies.", Nanoscale, vol. 8, issue 1, pp. 292-9, 2016 Jan 7.
2015
Van Aarle, W., W J. Palenstijn, J. De Beenhouwer, T. Altantzis, S. Bals, K. J. Batenburg, and J. Sijbers, "The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography", Ultramicroscopy, vol. 157, pp. 35–47, 2015. PDF icon Download paper (3.47 MB)
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
Van Eyndhoven, G., M. Kurttepeli, C. J. Van Oers, P. Cool, S. Bals, K. J. Batenburg, and J. Sijbers, "Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials", Ultramicroscopy, vol. 148, pp. 10-19, 2015.
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. van Nijs, M. A. van Huis, A. van Blaaderen, A. Sánchez-Iglesias, et al., "Quantitative 3D analysis of huge nanoparticle assemblies", Nanoscale, vol. 8, issue 1, pp. 292-299, 2015.
2014
Van Eyndhoven, G., K. J. Batenburg, C V. Oers, M. Kurttepeli, S. Bals, P. Cool, and J. Sijbers, "Reliable Pore-size Measurements Based on a Procedure Specifically Designed for Electron Tomography Measurements of Nanoporous Samples", International Congress on 3D Materials Science 2014 , 2014.
2013
Goris, B., T. Roelandts, K. J. Batenburg, H. Heidari Mezerji, and S. Bals, "Advanced reconstruction algorithms for electron tomography: from comparison to combination", Ultramicroscopy, vol. 127, pp. 40–47, 2013.
2012
Roelandts, T., K. J. Batenburg, E. Biermans, C. Kubel, S. Bals, and J. Sijbers, "Accurate segmentation of dense nanoparticles by partially discrete electron tomography", Ultramicroscopy, vol. 114, pp. 96-105, 2012. PDF icon Download paper (1.71 MB)
2011
Batenburg, K. J., S. Bals, S. Van Aert, T. Roelandts, and J. Sijbers, "Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap", Microscopy and Microanalysis 2011 Meeting, Nashville, TN, United States, 2011.
2010
Roelandts, T., K. J. Batenburg, E. Biermans, S. Bals, and J. Sijbers, "Partially Discrete Tomography for the Reconstruction of Dense Particles", 17th International Microscopy Congress (IMC17), Rio de Janeiro, Brazil, pp. I7.19, 2010.
2009
Batenburg, K. J., S. Bals, J. Sijbers, C. Kubel, P. A. Midgley, J. C. Hernandez, U. Kaiser, E. R. Encina, E. A. Coronado, and G. Van Tendeloo, "3D imaging of nanomaterials by discrete tomography", Ultramicroscopy, vol. 109, pp. 730-740, 2009.
2007
Bals, S., K. J. Batenburg, J. Verbeeck, J. Sijbers, and G. Van Tendeloo, "Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes", Nano Letters, vol. 7, no. 12, pp. 3669-3674, 2007.