Publications

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Author [ Type(Desc)] Year
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Journal Article
Van Aarle, W., K. J. Batenburg, G. Van Gompel, E. Van de Casteele, and J. Sijbers, "Super-resolution for computed tomography based on discrete tomography", IEEE Transactions on Image Processing, vol. 23, issue 3, pp. 1181 - 1193, 2014. PDF icon Download paper (2.24 MB)
Perfetti, G., E. Van de Casteele, B. Rieger, W. J. Wildeboer, and G. M. H. Meesters, "X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles", Advanced Powder Technology, vol. 21, issue 6, pp. 663 - 675, 11/2010.
Thesis
Van de Casteele, E., Model-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography, , Antwerp, University of Antwerp, 2004.

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