Publications

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Author Type [ Year(Desc)]
Filters: Author is Luis Filipe Alves Pereira  [Clear All Filters]
2013
L. F. Alves Pereira, Roelandts, T., and Sijbers, J., “Inline 3D X-ray Inspection of Food using Discrete Tomography”, in InsideFood Symposium, Leuven, Belgium, 2013.PDF icon Download paper (292.06 KB)
2014
L. F. Alves Pereira, Dabravolski, A., Tsang, I. R., Cavalcanti, G. D. C., and Sijbers, J., “Conveyor belt X-ray CT using Domain Constrained Discrete Tomography”, in Sibgrapi conference on Graphics, Patterns and Images, 2014, pp. 290 - 297.PDF icon Download paper (3.45 MB)
2016
E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast inline inspection by neural network based filtered backprojection: Application to apple inspection”, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.PDF icon Download paper (726.63 KB)
L. F. Alves Pereira, Janssens, E., Van Dael, M., Verboven, P., Nicolai, B., Cavalcanti, G. D. C., Tsang, I. J., and Sijbers, J., “Fast X-ray Computed Tomography via Image Completion”, in 6th Conference on Industrial Computed Tomography(iCT), Wels, Austria, 2016, pp. 1-5.
2017
L. F. Alves Pereira, Janssens, E., Cavalcanti, G. D. C., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Inline Discrete Tomography system: application to agricultural product inspection”, Computers and Electronics in Agriculture, vol. 138, pp. 117–126, 2017.
2020
L. F. Alves Pereira, De Beenhouwer, J., Kastner, J., and Sijbers, J., “Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks”, in ICTAI 2020, 2020.PDF icon Download paper (2.5 MB)