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2013
F. Bleichrodt, De Beenhouwer, J., Sijbers, J., and Batenburg, K. J., “An Alignment Method for Fan Beam Tomography”, in International Conference on Tomography of Materials and Structures (ICTMS), 2013, pp. 103-107.
2012
J. De Beenhouwer, Palenstijn, W. J., Bleichrodt, F., Batenburg, K. J., and Sijbers, J., “A framework for markerless alignment with full 3D flexibility”, European Microscopy Conference. 2012.PDF icon Download abstract (117.9 KB)

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