Publications

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Conference Paper
E. Janssens, Sijbers, J., Dierick, M., and De Beenhouwer, J., “Fast detection of cracks in ultrasonically welded parts by inline X-ray inspection”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.
Journal Article
T. De Schryver, Dhaene, J., Dierick, M., Boone, M. N., Janssens, E., Sijbers, J., Van Dael, M., Verboven, P., Nicolai, B., and Van Hoorebeke, L., “In-line NDT with X-Ray CT combining sample rotation and translation”, NDT & E International, vol. 89, pp. 89–98, 2016.
T. Van De Looverbosch, Bhuiyan, H. Rahman, Verboven, P., Dierick, M., Van Loo, D., De Beenhouwer, J., Sijbers, J., and Nicolai, B., “Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning”, Food Control, vol. 113, no. 107170, pp. 1-13, 2020.
Patent
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.