Publications

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Author Type [ Year(Desc)]
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2012
De Beenhouwer, J., W J. Palenstijn, F. Bleichrodt, K. J. Batenburg, and J. Sijbers, "A framework for markerless alignment with full 3D flexibility", European Microscopy Conference, 2012. PDF icon Download abstract (117.9 KB)
2013
Bleichrodt, F., J. De Beenhouwer, J. Sijbers, and K. J. Batenburg, "An Alignment Method for Fan Beam Tomography", International Conference on Tomography of Materials and Structures (ICTMS), pp. 103-107, 2013.
2014
Bleichrodt, F., J. De Beenhouwer, J. Sijbers, and K. J. Batenburg, "Aligning Projection Images from Binary Volumes", Fundamenta Informaticae, vol. 135, pp. 1-22, 2014.
2015
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. van Nijs, M. A. van Huis, A. van Blaaderen, A. Sánchez-Iglesias, et al., "Quantitative 3D analysis of huge nanoparticle assemblies", Nanoscale, vol. 8, issue 1, pp. 292-299, 2015.
2016
Bleichrodt, F., T. van Leeuwen, W J. Palenstijn, W. Van Aarle, J. Sijbers, and K. J. Batenburg, "Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators", Numerical Algorithms, vol. 71, no. 3, pp. 673-697, 2016.
Van Aarle, W., W J. Palenstijn, J. Cant, E. Janssens, F. Bleichrodt, A. Dabravolski, J. De Beenhouwer, K. J. Batenburg, and J. Sijbers, "Fast and Flexible X-ray Tomography Using the ASTRA Toolbox", Optics Express, vol. 24, no. 22, pp. 25129-25147, 2016. PDF icon Download paper (8.34 MB)
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. de Nijs, M. A. van Huis, A. Sánchez-Iglesias, L. M. Liz-Marzán, et al., "Quantitative 3D analysis of huge nanoparticle assemblies.", Nanoscale, vol. 8, issue 1, pp. 292-9, 2016 Jan 7.