Publications

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Author Type [ Year(Desc)]
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2020
M. Nauwynck, Bazrafkan, S., Van Heteren, A., De Beenhouwer, J., and Sijbers, J., “Ring Artifact Reduction in Sinogram Space Using Deep Learning”, in 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020.PDF icon Download paper (2.49 MB)
S. Bazrafkan, Van Nieuwenhove, V., Soons, J., De Beenhouwer, J., and Sijbers, J., “Ringing Artefact Removal From Sparse View Tomosynthesis using Deep Neural Networks”, in The 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020, pp. 380-383.PDF icon Download paper (570.79 KB)
J. Sanctorum, De Beenhouwer, J., and Sijbers, J., “X-ray phase contrast simulation for grating-based interferometry using GATE”, Optics Express, vol. 28, no. 22, pp. 33390-33412, 2020.PDF icon Download paper (2.5 MB)
2021
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., “Analysis of flat fields in edge illumination phase contrast imaging”, in IEEE International Symposium on Biomedical Imaging (ISBI) , 2021.
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Dark field sensitivity in a single mask edge illumination setup”, in IEEE International Symposium on Biomedical Imaging (ISBI) , 2021.
M. Ljubenović, Zhuang, L., De Beenhouwer, J., and Sijbers, J., “Joint Deblurring and Denoising of THz Time-Domain Images”, IEEE Access, vol. 9, pp. 162-176, 2021.PDF icon Download paper (2.38 MB)
J. Sanctorum, Van Wassenbergh, S., Nguyen, V., De Beenhouwer, J., Sijbers, J., and Dirckx, J. J. J., “Projection-angle-dependent distortion correction in high-speed image-intensifier-based x-ray computed tomography”, Measurement Science and Technology, vol. 32, no. 035404, pp. 1-11, 2021.
S. Bazrafkan, Van Nieuwenhove, V., Soons, J., De Beenhouwer, J., and Sijbers, J., “To Recurse or not to Recurse A Low Dose CT Study”, Progress in Artificial Intelligence, 2021.
In Press
B. De Samber, Renders, J., Elberfeld, T., Maris, Y., Sanctorum, J., Six, N., Liang, Z., De Beenhouwer, J., and Sijbers, J., “FleXCT: a Flexible X-ray CT scanner with 10 degrees of freedom”, Optics Express, In Press.

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