Publications

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2022
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “Analytic derivatives of scaling motion-compensated projection operators for dynamic computed tomography”, in 11th Conference on Industrial Computed Tomography, 2022.
Y. - T. Ling, Cools, S., Bogdanowicz, J., Fleischmann, C., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., “A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography”, Microscopy and Microanalysis, vol. 28, pp. 1-14, 2022.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based pose estimation from a single X-ray projection for 3D inspection of manufactured objects”, in 11th Conference on Industrial Computed Tomography, 2022.
J. Christopher, Lumbeeck, L. - P., Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Discrete Terahertz tomography: a simulation study ”, in 11th Conference on Industrial Computed Tomography, 2022.
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., “Sparse view rectangular X-ray CT for cargo inspection using the ASTRA toolbox”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
In Press
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “An accelerated motion-compensated iterative reconstruction technique for dynamic computed tomography”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., “Adaptive, multi-source, inline X-ray imaging for luggage inspection ”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
J. Sanctorum, Six, N., Sijbers, J., and De Beenhouwer, J., “Augmenting a conventional X-ray scanner with edge illumination based phase contrast imaging: how to design the gratings?”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV, In Press.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “Automatic anomaly detection from X-ray images based on autoencoder”, Nondestructive Testing and Evaluation, In Press.
P. Paramonov, Renders, J., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “Efficient X-ray projection of triangular meshes based on ray tracing and rasterization”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Novel grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV, In Press.
M. Yosifov, Reiter, M., Heupl, S., Gusenbauer, C., Fröhler, B., R. Gutierrez, F. -, De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Probability of Detection applied to X-ray inspection using numerical simulations”, Nondestructive Testing and Evaluation, In Press.

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