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1998
J. Sijbers, den Dekker, A. J., Van Audekerke, J., Verhoye, M., and Van Dyck, D., “Estimation of the noise in magnitude MR images”, Magnetic Resonance Imaging, vol. 16, pp. 87-90, 1998.PDF icon Download paper (64.9 KB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “How to design an HREM experiment so as to attain the highest precision?”, in ICEM14: 14th International Congress on Electron Microscopy, Cancun, Mexico, 1998, vol. 1, pp. 621-622.
J. Sijbers, den Dekker, A. J., Scheunders, P., and Van Dyck, D., “Maximum Likelihood estimation of Rician distribution parameters”, IEEE Transactions on Medical Imaging, vol. 17, pp. 357-361, 1998.PDF icon Download paper (106.26 KB)
A. J. den Dekker, Sijbers, J., Verhoye, M., and Van Dyck, D., “Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images”, in Proceedings of SPIE Medical Imaging, San Diego, California, USA, 1998, vol. 3338, pp. 408-415.
J. Sijbers, den Dekker, A. J., Verhoye, M., and Van Dyck, D., “Optimal estimation of T2 maps from magnitude MR data”, in Proceedings of SPIE Medical Imaging, San Diego, CA, USA, 1998, vol. 3338, pp. 384-390.PDF icon Download paper (1.04 MB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “Optimizing the design of an HREM experiment so as to attain the highest resolution”, in Proceedings of FEMMS98: Frontiers of Electron Microscopy in Material Science, Kloster Irsee, Germany, 1998.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., “Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory”, in Workshop: Towards Atomic Resolution Analysis 98, Port Ludlow, WA, U.S.A, 1998.
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., “Ultimate resolution in the framework of parameter estimation”, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
1997
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., den Dekker, A. J., and van den Bos, A., “From High Resolution Image to Atomic Structure: how fare are we?”, Scanning Microscopy, Special Issue on Image Processing, vol. 11, pp. 467-478, 1997.
A. J. den Dekker and van den Bos, A., “Resolution: a survey”, J. Opt. Soc. Am. A, vol. 14, pp. 547–557, 1997.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., “Resolving atoms: what do we have? what do we want?”, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
J. Sijbers, den Dekker, A. J., Scheunders, P., Raman, E., and Van Dyck, D., “Unbiased signal estimation in magnitude MR images”, in Proceedings of the European Society for Magnetic Resonance in Medicine and Biology, Brussels, Belgium, 1997, vol. 2, p. 174.

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