Publications

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2018
Janssens, E., J. De Beenhouwer, M. Van Dael, T. De Schryver, L. Van Hoorebeke, P. Verboven, B. Nicolai, and J. Sijbers, "Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection", Measurement Science and Technology, vol. 29, issue 3, 2018. PDF icon Download paper (3.4 MB)
2017
Van Nieuwenhove, V., J. De Beenhouwer, T. De Schryver, L. Van Hoorebeke, and J. Sijbers, "Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography", IEEE Transactions on Image Processing, vol. 26, issue 3, pp. 1441-1451, 2017.
2016
Van Dael, M., F. Danckaers, T. De Schryver, T. Huysmans, P. Verboven, L. Van Hoorebeke, J. Sijbers, and B. Nicolai, "Combining 3D vision and X-ray radiography for internal quality inspection of foods", 30th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference,, Austrian Economic Chamber, Vienna, Austria, 28-30 November, 2016.
De Schryver, T., J. Dhaene, M. Dierick, M. N. Boone, E. Janssens, J. Sijbers, M. Van Dael, P. Verboven, B. Nicolai, and L. Van Hoorebeke, "In-line NDT with X-Ray CT combining sample rotation and translation", NDT & E International, vol. 89, pp. 89–98, 2016.
2015
Van Nieuwenhove, V., J. De Beenhouwer, T. De Schryver, L. Van Hoorebeke, and J. Sijbers, "Affine deformation correction in cone beam Computed Tomography", Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, pp. 182-185, 2015. PDF icon Download paper (2.91 MB)
De Schryver, T., M. Dierick, L. Van Hoorebeke, P. Verboven, M. Van Dael, and J. Sijbers, Tomography for in-line product inspection, , no. EP3106863A1, 2015.