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D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.PDF icon Download paper (protected) (1.79 MB)