Publications

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Conference Abstract
B. Auer, Kalluri, K., De Beenhouwer, J., Zeraatkar, N., Könik, A., Kuo, P. H., Furenlid, L. R., and King, M. A., “Investigation of keel versus knife edge pinhole profiles for a next-generation SPECT system dedicated to clinical brain imaging”, 2nd International Conference on Monte Carlo Techniques for Medical Applications. 2019.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
J. De Beenhouwer, Palenstijn, W. J., Bleichrodt, F., Batenburg, K. J., and Sijbers, J., “A framework for markerless alignment with full 3D flexibility”, European Microscopy Conference. 2012.PDF icon Download abstract (117.9 KB)
V. Van Nieuwenhove, De Beenhouwer, J., and Sijbers, J., “A fast 4D CT reconstruction algorithm for affine deforming objects”, Applied inverse problems conference. 2015.
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge Illumination Phase Contrast Simulations Using the OptiX GPU Ray Tracing Engine”, 5th International Conference on Tomography of Materials & Structures (ICTMS). 2022.
E. Janssens, De Beenhouwer, J., Sanctorum, J., Senck, S., Heinzl, C., and Sijbers, J., “Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample”, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 79-80, 2017.PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
J. Rimpelainen, Bazrafkan, S., Sijbers, J., and De Beenhouwer, J., “Deep learning based missing wedge artefact removal for electron tomography”, Microscopy Conference, Berlin, Germany. pp. 660-661, 2019.
V. Van Nieuwenhove, Van Eyndhoven, G., De Beenhouwer, J., and Sijbers, J., “Compensation of affine deformations in fan and cone beam projections”, Micro-CT User Meeting. pp. 187-189, 2014.PDF icon Download abstract (285.55 KB)
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “AdAPTS: An Adaptive Atom Probe Tomography Simulation Library”, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
J. Merckx, van Lith, B., Sijbers, J., and De Beenhouwer, J., “Adaptive triangular mesh for phase contrast imaging”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
S. Hosseinnejad, Bosch, E. G. T., Kohr, H., Lazić, I., Zharinov, V., Franken, E., Sijbers, J., and De Beenhouwer, J., “3D atomic resolution tomography from iDPC-STEM images using multiple atom model prior”, Microscopy Conference. 2021.PDF icon Download abstract (534.35 KB)

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