Publications

Export 178 results:
Author [ Type(Asc)] Year
Filters: Author is Jan De Beenhouwer  [Clear All Filters]
Conference Abstract
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “AdAPTS: An Adaptive Atom Probe Tomography Simulation Library”, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
J. Merckx, van Lith, B., Sijbers, J., and De Beenhouwer, J., “Adaptive triangular mesh for phase contrast imaging”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
S. Hosseinnejad, Bosch, E. G. T., Kohr, H., Lazić, I., Zharinov, V., Franken, E., Sijbers, J., and De Beenhouwer, J., “3D atomic resolution tomography from iDPC-STEM images using multiple atom model prior”, Microscopy Conference. 2021.PDF icon Download abstract (534.35 KB)

Pages