Publications

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Author [ Type(Desc)] Year
Filters: Author is Rudolf Hanel  [Clear All Filters]
Conference Paper
Hanel, R., K. J. Batenburg, and J. Sijbers, "Fast bias field estimation by localized Lloyd-Max quantization", SPIE Medical Imaging, San Diego, CA, USA, February, 2008. PDF icon Download full paper (297.69 KB)
Journal Article
Mai, Z., R. Hanel, K. J. Batenburg, M. Verhoye, P. Scheunders, and J. Sijbers, "Bias field reduction by localized Lloyd-Max quantization", Magnetic Resonance Imaging, vol. 29, issue 4, pp. 536-545, 2011.