Publications

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2014
Roelandts, T., K. J. Batenburg, A J. den Dekker, and J. Sijbers, "The reconstructed residual error: A novel segmentation evaluation measure for reconstructed images in tomography", Computer Vision and Image Understanding, vol. 126, pp. 28-37, 2014. PDF icon Download paper (4.58 MB)
2013
Goris, B., T. Roelandts, K. J. Batenburg, H. Heidari Mezerji, and S. Bals, "Advanced reconstruction algorithms for electron tomography: from comparison to combination", Ultramicroscopy, vol. 127, pp. 40–47, 2013.
Alves Pereira, L. F., T. Roelandts, and J. Sijbers, "Inline 3D X-ray Inspection of Food using Discrete Tomography", InsideFood Symposium, Leuven, Belgium, 2013. PDF icon Download paper (292.06 KB)
Roelandts, T., "Local Prior Knowledge in Tomography", Department of Physics, vol. PhD in Sciences: Physics, 11/2013. PDF icon Download PhD thesis (15.6 MB)
Roelandts, T., K. J. Batenburg, and J. Sijbers, "Localizing DART using the Reconstructed Residual Error", 1st International Conference on Tomography of Materials and Structures (ICTMS), vol. Book of Abstracts: Talks, Ghent, Belgium, pp. 113-116, 2013. PDF icon Download full paper (491.53 KB)
2012
Roelandts, T., K. J. Batenburg, E. Biermans, C. Kubel, S. Bals, and J. Sijbers, "Accurate segmentation of dense nanoparticles by partially discrete electron tomography", Ultramicroscopy, vol. 114, pp. 96-105, 2012. PDF icon Download paper (1.71 MB)
Roelandts, T., K. J. Batenburg, and J. Sijbers, "Visualizing the Segmentation Error of a Tomogram using the Residual Projection Error", The Second International Conference on Image Formation in X-Ray Computed Tomography (CT Meeting), Salt Lake City, UT, USA, pp. 293-296, 2012. PDF icon Download full paper (2.83 MB)
2011
Roelandts, T., K. J. Batenburg, and J. Sijbers, "PDART: A Partially Discrete Algorithm for the Reconstruction of Dense Particles", 11th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully 3D), Potsdam, Germany, pp. 448-451, 2011. PDF icon Download full paper (1.74 MB)
Batenburg, K. J., S. Bals, S. Van Aert, T. Roelandts, and J. Sijbers, "Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap", Microscopy and Microanalysis 2011 Meeting, Nashville, TN, United States, 2011.
2010
Roelandts, T., K. J. Batenburg, E. Biermans, S. Bals, and J. Sijbers, "Partially Discrete Tomography for the Reconstruction of Dense Particles", 17th International Microscopy Congress (IMC17), Rio de Janeiro, Brazil, pp. I7.19, 2010.