Publications

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Conference Abstract
Ling, Y-T., S. Cools, J. De Beenhouwer, J. Sijbers, and W. Vandervorst, "A Trajectory Based Bottom-Up Volume Reconstruction Method for Atom Probe Tomography", European Atom Probe Workshop, 2019.
Elberfeld, T., J. De Beenhouwer, A J. den Dekker, C. Heinzl, and J. Sijbers, "Parametric Reconstruction of Advanced Glass Fiber-reinforced Polymer Composites from X-ray Images", 8th Conference on Industrial Computed Tomography, Wels, Austria, 2018. PDF icon Download paper (636.09 KB)
Elberfeld, T., S. Bazrafkan, J. De Beenhouwer, and J. Sijbers, "Mixed-Scale Dense Convolutional Neural Network based Improvement of Glass Fiber-reinforced Composite CT Images", 4th International Conference on Tomography of Materials & Structures, 07/2019.
Auer, B., K. Kalluri, J. De Beenhouwer, N. Zeraatkar, A. Könik, P. H. Kuo, L. R. Furenlid, and M. A. King, "Investigation of keel versus knife edge pinhole profiles for a next-generation SPECT system dedicated to clinical brain imaging", 2nd International Conference on Monte Carlo Techniques for Medical Applications, 2019.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, J. Sijbers, G. Van Tendeloo, et al., "Investigating lattice strain in Au nanodecahedrons", European Microscopy Congress 2016, 2016.
De Beenhouwer, J., W J. Palenstijn, F. Bleichrodt, K. J. Batenburg, and J. Sijbers, "A framework for markerless alignment with full 3D flexibility", European Microscopy Conference, 2012. PDF icon Download abstract (117.9 KB)
Van Nieuwenhove, V., J. De Beenhouwer, and J. Sijbers, "A fast 4D CT reconstruction algorithm for affine deforming objects", Applied inverse problems conference, Helsinki, 2015.
Janssens, E., J. De Beenhouwer, J. Sanctorum, S. Senck, C. Heinzl, and J. Sijbers, "Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample", 4th Conference on X-ray and Neutron Phase Imaging with Gratings, Zürich, Switzerland, pp. 79-80, 2017. PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
Rimpelainen, J., S. Bazrafkan, J. Sijbers, and J. De Beenhouwer, "Deep learning based missing wedge artefact removal for electron tomography", Microscopy Conference, Berlin, Germany, pp. 660-661, 2019.
Van Nieuwenhove, V., G. Van Eyndhoven, J. De Beenhouwer, and J. Sijbers, "Compensation of affine deformations in fan and cone beam projections", Micro-CT User Meeting, pp. 187-189, 2014. PDF icon Download abstract (285.55 KB)

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