Publications

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Journal Article
De Backer, A., K. H. W. van den Bos, W. Van den Broek, J. Sijbers, and S. Van Aert, "StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images", Ultramicroscopy, vol. 171, pp. 104–116, 2016.
Fatermans, J., A J. den Dekker, K.. Müller-Caspary, I. Lobato, C.. M. O'Leary, P. D. Nellist, and S. Van Aert, "Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images", Phys. Rev. Lett., vol. 121, pp. 056101, Jul, 2018.
Gonnissen, J., A. De Backer, A J. den Dekker, G. T. Martinez, A. Rosenauer, J. Sijbers, and S. Van Aert, "Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images", Applied Physics Letters, vol. 105, issue 063116, 2014.
Van den Broek, W., A. Rosenauer, J. Sijbers, D. Van Dyck, and S. Van Aert, "A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Ultramicroscopy", Ultramicroscopy, vol. 141, pp. 22–31, 2014.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
Fatermans, J., S. Van Aert, and A J. den Dekker, "The maximum a posteriori probability rule for atom column detection from HAADF STEM images", Ultramicroscopy, vol. 201, pp. 81-91, 2019.
den Dekker, A J., J. Gonnissen, A. De Backer, J. Sijbers, and S. Van Aert, "Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?", Ultramicroscopy, vol. 134, pp. 34-43, 2013.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy", Ultramicroscopy, vol. 170, pp. 128-138, 2016.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question", Ultramicroscopy, vol. 147, pp. 112–120, 2017.
Van Aert, S., A. De Backer, G. T. Martinez, A J. den Dekker, D. Van Dyck, S. Bals, and G. Van Tendeloo, "Advanced electron crystallography through model-based imaging", IUCrJ, vol. 3, no. 1, Jan, 2016.
Conference Abstract
Batenburg, K. J., S. Bals, S. Van Aert, T. Roelandts, and J. Sijbers, "Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap", Microscopy and Microanalysis 2011 Meeting, Nashville, TN, United States, 2011.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images", IMC19, Sydney, Australia, 2018.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, J. Sijbers, G. Van Tendeloo, et al., "Investigating lattice strain in Au nanodecahedrons", European Microscopy Congress 2016, 2016.
Fatermans, J., K. Müller-Caspary, A J. den Dekker, and S. Van Aert, "Detection of atomic columns from noisy STEM images", Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, pp. 445-446, 2017.
Fatermans, J., S. Van Aert, and A J. den Dekker, "Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images", RBSM 2016, Brussels, Belgium, pp. 53, 2016.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection", SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, pp. 95, 2018.