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Conference Abstract
B. Jeurissen, Tournier, J. - D., and Sijbers, J., Tissue-type segmentation using non-negative matrix factorization of multi-shell diffusion-weighted MRI images, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 349, 2015.PDF icon Download abstract (1.11 MB)
Y. - T. Ling, Cools, S., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., A Trajectory Based Bottom-Up Volume Reconstruction Method for Atom Probe Tomography, European Atom Probe Workshop. 2019.
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.
Z. Wang, Rogge, S., Van Dael, M., Van Nieuwenhove, V., Verboven, P., Sijbers, J., and Nicolai, B., Understanding microstructural deformation of apple tissue from 4D micro-CT imaging, ISHS Symposium 2016: Sensing Plant Water Status - Methods and Applications in Horticultural Science. Potsdam, Germany, 5-7 October. 2016.
M. Siqueira Pinto, Paolella, R., Billiet, T., Van Dyck, P., Guns, P. - J., Jeurissen, B., Ribbens, A., den Dekker, A. J., and Sijbers, J., Voxelwise harmonisation of FA on a cohort of 605 healthy subjects using ComBat: an exploratory study, ESMRMB 2019, 36th Annual Scientific Meeting, Rotterdam, NL. 2019.
J. Veraart, Sijbers, J., Sunaert, S., Leemans, A., and Jeurissen, B., “The weighted linear least squares for estimating diffusion (kurtosis) tensors: Revisited, ISMRM Workshop on Diffusion as a Probe of Neural Tissue Microstructure. Podstrana, Croatia, 2013.
J. Sanctorum, Janssens, E., den Dekker, A. J., Senck, S., Heinzl, C., De Beenhouwer, J., and Sijbers, J., A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 139-140, 2017.PDF icon Download poster (1008.67 KB)PDF icon Download abstract (294.87 KB)
Conference Paper
J. Van Houtte, Gao, X., Sijbers, J., and Zheng, G., 2D/3D registration with a statistical deformation model prior using deep learning, in the IEEE International Conference on Biomedical and Health Informatics (BHI'21) , 2021, pp. 1-4.PDF icon Download paper (1.41 MB)
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., 3D imaging of semiconductor components by discrete laminography, in Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings, 2014, vol. 1601, pp. 168-179.PDF icon Download paper (1.81 MB)
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., 3D THz Tomography Incorporating the Beam Shape, in 2021 OSA Imaging and Applied Optics Congress, 2021.
W. Van Aarle, Van Gompel, G., Batenburg, K. J., Van de Casteele, E., and Sijbers, J., A 3-dimensional discrete tomography approach for superresolution micro-CT images: application to foams, in The first international conference on image formation in X-ray computed tomography, 2010, pp. 45-48.PDF icon Download full paper (816.87 KB)
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., An accelerated motion-compensated iterative reconstruction technique for dynamic computed tomography, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122421F, San Diego, CA, United States, 2022.
P. Paramonov, Lumbeeck, L. - P., De Beenhouwer, J., and Sijbers, J., Accurate terahertz simulation with ray tracing incorporating beam shape and refraction, in IEEE ICIP , 2020, pp. 3035-3039.PDF icon Download paper (190.62 KB)
J. Sijbers, den Dekker, A. J., Verhoye, M., Van Der Linden, A., and Van Dyck, D., Adaptive anisotropic noise filtering for magnitude MR data, in Proceedings of SPIE Medical Imaging, San Diego, USA, 1999, vol. 3661, pp. 1418-1425.
J. Rajan, Van Audekerke, J., Van Der Linden, A., Verhoye, M., and Sijbers, J., An adaptive non local maximum likelihood estimation method for denoising magnetic resonance images, in IEEE International Symposium on Biomedical Imaging (ISBI), 2012.PDF icon Download full paper (307.46 KB)
D. Frenkel, De Beenhouwer, J., and Sijbers, J., An adaptive probability map for the Discrete Algebraic Reconstruction Technique, in 10th Conference on Industrial Computed Tomography (ICT 2020), 2020, pp. 1-6.
A. Dabravolski, Batenburg, K. J., and Sijbers, J., Adaptive Zooming in X-ray Computed Tomography, in 1st International Conference on Tomography of Materials and Structures (ICTMS), Ghent, Belgium, 2013, pp. 5-8.PDF icon Download full paper (633.7 KB)PDF icon Download poster (1.18 MB)
J. Renders, Sijbers, J., and De Beenhouwer, J., Adjoint pairs of image warping operators for motion modeling in 4D-CT, in 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020.PDF icon Download paper (617.11 KB)
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., Affine deformation correction in cone beam Computed Tomography, in Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, 2015, pp. 182-185.
G. Van Eyndhoven, Batenburg, K. J., and Sijbers, J., An Algebraic Reconstruction Technique for the Study of Local Structural Changes during CT, in 1st International Conference on Tomography of Materials and Structures (ICTMS), 2013, pp. 137-141.
S. van der Maar, Batenburg, K. J., and Sijbers, J., Algebraic tomographic reconstruction on the GPU, in Liège Image Days 2008: Medical Imaging, 2008.
J. Sijbers, Ceulemans, T., and Van Dyck, D., Algorithm for the computation of 3D Fourier descriptors, in 16th International Conference on Pattern Recognition, Quebec, Canada, 2002, pp. 790-793.PDF icon Download paper (665.86 KB)
F. Bleichrodt, De Beenhouwer, J., Sijbers, J., and Batenburg, K. J., An Alignment Method for Fan Beam Tomography, in International Conference on Tomography of Materials and Structures (ICTMS), 2013, pp. 103-107.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., Analysis of flat fields in edge illumination phase contrast imaging, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.PDF icon Download paper (368.24 KB)