Publications

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Journal Article
Janssens, E., J. De Beenhouwer, M. Van Dael, T. De Schryver, L. Van Hoorebeke, P. Verboven, B. Nicolai, and J. Sijbers, "Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection", Measurement Science and Technology, vol. 29, issue 3, 2018. PDF icon Download paper (3.4 MB)
De Schryver, T., J. Dhaene, M. Dierick, M. N. Boone, E. Janssens, J. Sijbers, M. Van Dael, P. Verboven, B. Nicolai, and L. Van Hoorebeke, "In-line NDT with X-Ray CT combining sample rotation and translation", NDT & E International, vol. 89, pp. 89–98, 2016.
Alves Pereira, L. F., E. Janssens, G. D. C. Cavalcanti, I R. Tsang, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers, "Inline Discrete Tomography system: application to agricultural product inspection", Computers and Electronics in Agriculture, vol. 138, pp. 117–126, 2017.
Janssens, E., D. Pelt, J. De Beenhouwer, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers, "Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt", Chemical Engineering Transactions, vol. 44, Milano, Italy, pp. 181-186, 2015.
Janssens, E., L. F. Alves Pereira, J. De Beenhouwer, I R. Tsang, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers, "Fast inline inspection by neural network based filtered backprojection: Application to apple inspection", Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016. PDF icon Download paper (726.63 KB)
Van Aarle, W., W J. Palenstijn, J. Cant, E. Janssens, F. Bleichrodt, A. Dabravolski, J. De Beenhouwer, K. J. Batenburg, and J. Sijbers, "Fast and Flexible X-ray Tomography Using the ASTRA Toolbox", Optics Express, vol. 24, no. 22, pp. 25129-25147, 2016. PDF icon Download paper (8.34 MB)
Conference Abstract
Sanctorum, J., E. Janssens, A J. den Dekker, S. Senck, C. Heinzl, J. De Beenhouwer, and J. Sijbers, "A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples", 4th Conference on X-ray and Neutron Phase Imaging with Gratings, Zürich, Switzerland, pp. 139-140, 2017. PDF icon Download poster (1008.67 KB)PDF icon Download abstract (294.87 KB)
Janssens, E., J. De Beenhouwer, J. Sanctorum, S. Senck, C. Heinzl, and J. Sijbers, "Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample", 4th Conference on X-ray and Neutron Phase Imaging with Gratings, Zürich, Switzerland, pp. 79-80, 2017. PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)