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Batenburg, K. J., S. Bals, S. Van Aert, T. Roelandts, and J. Sijbers, "Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap", Microscopy and Microanalysis 2011 Meeting, Nashville, TN, United States, 2011.
Roelandts, T., K. J. Batenburg, E. Biermans, S. Bals, and J. Sijbers, "Partially Discrete Tomography for the Reconstruction of Dense Particles", 17th International Microscopy Congress (IMC17), Rio de Janeiro, Brazil, pp. I7.19, 2010.