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Journal Article
Mai, Z., R. Hanel, K. J. Batenburg, M. Verhoye, P. Scheunders, and J. Sijbers, "Bias field reduction by localized Lloyd-Max quantization", Magnetic Resonance Imaging, vol. 29, issue 4, pp. 536-545, 2011.
Conference Paper
Hanel, R., K. J. Batenburg, and J. Sijbers, "Fast bias field estimation by localized Lloyd-Max quantization", SPIE Medical Imaging, San Diego, CA, USA, February, 2008. PDF icon Download full paper (297.69 KB)