Publications

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Journal Article
Van Aert, S., A. De Backer, G. T. Martinez, A J. den Dekker, D. Van Dyck, S. Bals, and G. Van Tendeloo, "Advanced electron crystallography through model-based imaging", IUCrJ, vol. 3, no. 1, Jan, 2016.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question", Ultramicroscopy, vol. 147, pp. 112–120, 2017.
Gonnissen, J., A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert, "Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy", Ultramicroscopy, vol. 170, pp. 128-138, 2016.
den Dekker, A J., J. Gonnissen, A. De Backer, J. Sijbers, and S. Van Aert, "Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?", Ultramicroscopy, vol. 134, pp. 34-43, 2013.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
Gonnissen, J., A. De Backer, A J. den Dekker, G. T. Martinez, A. Rosenauer, J. Sijbers, and S. Van Aert, "Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images", Applied Physics Letters, vol. 105, issue 063116, 2014.
De Backer, A., K. H. W. van den Bos, W. Van den Broek, J. Sijbers, and S. Van Aert, "StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images", Ultramicroscopy, vol. 171, pp. 104–116, 2016.