Publications

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In Press
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., An accelerated motion-compensated iterative reconstruction technique for dynamic computed tomography, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., Adaptive, multi-source, inline X-ray imaging for luggage inspection , in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
J. Sanctorum, Six, N., Sijbers, J., and De Beenhouwer, J., Augmenting a conventional X-ray scanner with edge illumination based phase contrast imaging: how to design the gratings?, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV, In Press.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., Automatic anomaly detection from X-ray images based on autoencoder, Nondestructive Testing and Evaluation, In Press.
P. Paramonov, Renders, J., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., Efficient X-ray projection of triangular meshes based on ray tracing and rasterization, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , In Press.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., Novel grating designs for cone-beam edge illumination X-ray phase contrast imaging, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV, In Press.
M. Yosifov, Reiter, M., Heupl, S., Gusenbauer, C., Fröhler, B., R. Gutierrez, F. -, De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., Probability of Detection applied to X-ray inspection using numerical simulations, Nondestructive Testing and Evaluation, In Press.

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