Publications

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G. Van de Wouwer, Weyn, B., Scheunders, P., Jacob, W., Van Marck, E., and Van Dyck, D., “Automated chromatin-texture based diagnosis of carcinoma nuclei”, Journal of Microscopy, vol. 197, pp. 25-35, 2000.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Wuyts, F. L., and Van de Heyning, P. H., “Voice recognition from spectrograms: a wavelet based approach”, Fractals, vol. 5, pp. 165-172, 1997.
T. Van De Looverbosch, Jiaqi, H., Tempelaere, A., Kelchtermans, K., Verboven, P., Tuytelaars, T., Sijbers, J., and Nicolai, B., “Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images”, Computers and Electronics in Agriculture, vol. 197, no. 106962, pp. 1-14, 2022.
T. Van De Looverbosch, Bhuiyan, H. Rahman, Verboven, P., Dierick, M., Van Loo, D., De Beenhouwer, J., Sijbers, J., and Nicolai, B., “Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning”, Food Control, vol. 113, no. 107170, pp. 1-13, 2020.
T. Van De Looverbosch, De Beuckeleer, S., De Smet, F., Sijbers, J., and De Vos, W., “Proximity Adjusted Centroid Mapping for Accurate Detection of Nuclei in Dense 3D Cell Systems”, Computers in Biology and Medicine, vol. 185, p. 109561, 2025.
T. Van De Looverbosch, Raeymaekers, E., Verboven, P., Sijbers, J., and Nicolai, B., “Non-destructive internal disorder detection of Conference pears by semantic segmentation of X-ray CT scans using deep learning”, Expert Systems with Applications, vol. 176, no. 114925, pp. 1-12, 2021.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “Effect of beam hardening on resolution in x-ray microtomography”, in SPIE Medical Imaging: Image Processing, San Diego CA, USA, 2004, vol. 5370, pp. 2089-2096.PDF icon Download paper (156.85 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “A model-based correction method for beam-hardening artifacts in X-ray tomography”, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
E. Van de Casteele, Parizel, P. M., and Sijbers, J., “Quantitative evaluation of ASiR image quality: an adaptive statistical iterative reconstruction technique”, in SPIE Medical Imaging, 2012, vol. 8313.PDF icon Download abstract (453.01 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “An energy-based beam hardening model in tomography”, Physics in Medicine and Biology, vol. 47, pp. 4181-4190, 2002.PDF icon Download full paper (203.21 KB)
E. Van de Casteele, “Model-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography”, University of Antwerp, Antwerp, 2004.
E. Van de Casteele, Batenburg, K. J., Salmon, P., and Sijbers, J., “Bone segmentation using discrete tomography”, in Micro-CT User Meeting, 2011, pp. 178-183.PDF icon Download paper (107.53 KB)
E. Van de Casteele, Perilli, E., Van Aarle, W., Reynolds, K., and Sijbers, J., “Discrete tomography in an in vivo small animal bone study”, Journal of Bone and Mineral Metabolism, vol. 36, no. 1, pp. 40–53, 2018.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “Modelling of Beam hardening in micro CT”, in IEEE International Symposium on Biomedical Imaging, Washington DC, USA, 2003, pp. 57-58.PDF icon Download full paper (163.52 KB)
E. Van de Casteele, Bugani, S., Camaiti, M., Morselli, L., and Janssens, K., “X-ray microtomography as a non-destructive tool for stone characterization in a conservation study”, in 4th ICNDT Hellenic Society, 2007.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “A bimodal energy model for correcting beam hardening artefacts in X-ray tomography”, in IEEE 29th Annual Northeast Bioengineering Conference2003 IEEE 29th Annual Proceedings of Bioengineering Conference, Newark, NJ, USA, 2003, pp. 57 - 58.
E. Van de Casteele, Bugani, S., Van Der Linden, A., and Janssens, K., “X-ray microtomography as an imaging tool in cultural heritage”, 9th International Conference on NDT of Art. 2008.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “A model-based correction method for beam hardening artefacts in X-ray microtomography”, Journal of X-ray science and technology, vol. 12, pp. 53-57, 2004.PDF icon Download full paper (632.04 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “The effect of beam hardening on MTF measurements in X-ray microtomography”, in 19th Annual Symposium of the Belgian Hospital Physicists Association, 2004.
M. Van Dael, Lebotsa, S., Herremans, E., Verboven, P., Sijbers, J., Opara, U. L., Cronje, U. L., and Nicolai, B., “A segmentation and classification algorithm for online detection of internal disorders in citrus using X-ray radiographs”, Postharvest Biology and Technology, vol. 112, pp. 205-214, 2016.
M. Van Dael, Rogge, S., Verboven, P., Saeys, W., Sijbers, J., and Nicolai, B., “Online Tomato Inspection Using X-Ray Radiographies and 3- Dimensional Shape Models”, Chemical Engineering Transactions, vol. 44, pp. 37-42, 2015.
M. Van Dael, Verboven, P., Zanella, A., Sijbers, J., and Nicolai, B., “Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography”, Postharvest Biology and Technology, vol. 148, pp. 218-227, 2019.
M. Van Dael, Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Comparison of methods for online inspection of apple internal quality”, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (815.39 KB)
M. Van Dael, Verboven, P., Dhaene, J., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Multisensor X-ray inspection of internal defects in horticultural products”, Postharvest Biology and Technology, vol. 128, pp. 33–43, 2017.
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.

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