Publications

Export 13 results:
Author Type [ Year(Asc)]
Filters: First Letter Of Last Name is J and Author is Eline Janssens  [Clear All Filters]
2019
E. Janssens, Sijbers, J., Dierick, M., and De Beenhouwer, J., “Fast detection of cracks in ultrasonically welded parts by inline X-ray inspection”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.
2018
E. Janssens, “Advances in X-ray reconstruction algorithms for limited data problems in conventional and non-conventional projection geometries”, 2018.PDF icon Download thesis (17.29 MB)
E. Janssens, De Beenhouwer, J., Van Dael, M., De Schryver, T., Van Hoorebeke, L., Verboven, P., Nicolai, B., and Sijbers, J., “Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection”, Measurement Science and Technology, vol. 29, no. 3, 2018.PDF icon Download paper (3.4 MB)
2017
E. Janssens, De Beenhouwer, J., Sanctorum, J., Senck, S., Heinzl, C., and Sijbers, J., “Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample”, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 79-80, 2017.PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
E. Janssens, Senck, S., Heinzl, C., Kastner, J., De Beenhouwer, J., and Sijbers, J., “Fast Reconstruction of CFRP X-ray Images based on a Neural Network Filtered Backprojection Approach”, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (345.06 KB)
L. F. Alves Pereira, Janssens, E., Cavalcanti, G. D. C., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Inline Discrete Tomography system: application to agricultural product inspection”, Computers and Electronics in Agriculture, vol. 138, pp. 117–126, 2017.
J. Sanctorum, Janssens, E., den Dekker, A. J., Senck, S., Heinzl, C., De Beenhouwer, J., and Sijbers, J., “A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples”, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 139-140, 2017.PDF icon Download poster (1008.67 KB)PDF icon Download abstract (294.87 KB)
2016
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., “Fast and Flexible X-ray Tomography Using the ASTRA Toolbox”, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)
E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast inline inspection by neural network based filtered backprojection: Application to apple inspection”, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.PDF icon Download paper (726.63 KB)
L. F. Alves Pereira, Janssens, E., Van Dael, M., Verboven, P., Nicolai, B., Cavalcanti, G. D. C., Tsang, I. J., and Sijbers, J., “Fast X-ray Computed Tomography via Image Completion”, in 6th Conference on Industrial Computed Tomography(iCT), Wels, Austria, 2016, pp. 1-5.
T. De Schryver, Dhaene, J., Dierick, M., Boone, M. N., Janssens, E., Sijbers, J., Van Dael, M., Verboven, P., Nicolai, B., and Van Hoorebeke, L., “In-line NDT with X-Ray CT combining sample rotation and translation”, NDT & E International, vol. 89, pp. 89–98, 2016.
2015
E. Janssens, Pelt, D., De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt”, Chemical Engineering Transactions, vol. 44, pp. 181-186, 2015.
E. Janssens, De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt”, in IEEE International Conference on Image Processing, 2015, pp. 917-921.