Tom Roelandts

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Journal Article
T. Roelandts, Batenburg, K. J., den Dekker, A. J., and Sijbers, J., “The reconstructed residual error: A novel segmentation evaluation measure for reconstructed images in tomography”, Computer Vision and Image Understanding, vol. 126, pp. 28-37, 2014.PDF icon Download paper (4.58 MB)
B. Goris, Roelandts, T., Batenburg, K. J., Heidari Mezerji, H., and Bals, S., “Advanced reconstruction algorithms for electron tomography: from comparison to combination”, Ultramicroscopy, vol. 127, pp. 40–47, 2013.
Conference Paper
L. F. Alves Pereira, Roelandts, T., and Sijbers, J., “Inline 3D X-ray Inspection of Food using Discrete Tomography”, in InsideFood Symposium, Leuven, Belgium, 2013.PDF icon Download paper (292.06 KB)
Thesis
T. Roelandts, “Local Prior Knowledge in Tomography”, 2013.PDF icon Download PhD thesis (15.6 MB)
Conference Paper
T. Roelandts, Batenburg, K. J., and Sijbers, J., “Localizing DART using the Reconstructed Residual Error”, in 1st International Conference on Tomography of Materials and Structures (ICTMS), Ghent, Belgium, 2013, vol. Book of Abstracts: Talks, pp. 113-116.PDF icon Download full paper (491.53 KB)
Journal Article
T. Roelandts, Batenburg, K. J., Biermans, E., Kubel, C., Bals, S., and Sijbers, J., “Accurate segmentation of dense nanoparticles by partially discrete electron tomography”, Ultramicroscopy, vol. 114, pp. 96-105, 2012.PDF icon Download paper (1.71 MB)
Conference Paper
T. Roelandts, Batenburg, K. J., and Sijbers, J., “Visualizing the Segmentation Error of a Tomogram using the Residual Projection Error”, in The Second International Conference on Image Formation in X-Ray Computed Tomography (CT Meeting), Salt Lake City, UT, USA, 2012, pp. 293-296.
T. Roelandts, Batenburg, K. J., and Sijbers, J., “PDART: A Partially Discrete Algorithm for the Reconstruction of Dense Particles”, in 11th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully 3D), Potsdam, Germany, 2011, pp. 448-451.PDF icon Download full paper (1.74 MB)
Conference Abstract
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., “Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap”, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.
T. Roelandts, Batenburg, K. J., Biermans, E., Bals, S., and Sijbers, J., “Partially Discrete Tomography for the Reconstruction of Dense Particles”, 17th International Microscopy Congress (IMC17). Rio de Janeiro, Brazil, p. I7.19, 2010.