Jan Sijbers

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Conference Paper
M. Van Dael, Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., Comparison of methods for online inspection of apple internal quality, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (815.39 KB)
Conference Abstract
E. Janssens, De Beenhouwer, J., Sanctorum, J., Senck, S., Heinzl, C., and Sijbers, J., Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 79-80, 2017.PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
Conference Abstract
P. Bladt, den Dekker, A. J., Clement, P., Achten, E., and Sijbers, J., Maximizing precision in PCASL MRI using an optimized sampling strategy, 34th Annual Scientific Meeting of the European Society for Magnetic Resonance in Medicine & Biology, Barcelona, Spain. 2017.

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