Jan Sijbers

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Conference Paper
G. Van Eyndhoven, Batenburg, K. J., and Sijbers, J., Region based 4D tomographic image reconstruction: application to cardiac X-ray CT, in IEEE International Conference on Image Processing, 2015, pp. 113 - 117.PDF icon Download paper (708.79 KB)
Conference Abstract
J. Soons, Danckaers, F., Huysmans, T., Sijbers, J., Casselamn, J. W., and Dirckx, J. J. J., Statistical shape modeling of the incudomalleolar complex using micro-CT and clinical cone-beam CT, MEMRO: 7th International Symposium on Middle Ear Mechanics in Research and Otology. Aalborg, Denmark, 2015.
Conference Abstract
G. Van Steenkiste, Hamaide, J., Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Sijbers, J., and Verhoye, M., Super-resolution structural connectivity and anatomy of the zebra finch brain , ISMRM Benelux. 2015.
G. Van Steenkiste, Poot, D. H. J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., Super-resolution T1 mapping: a simulation study, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 1679, 2015.PDF icon Download abstract (1.22 MB)
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., Theoretical study of the free water elimination model, Proc. Intl. Soc. Mag. Reson. Med. 23, vol. 15. p. 2757, 2015.
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., Theoretical study of the free water elimination model, 7th Annual Meeting of the Benelux ISMRM Chapter, Ghent, Belgium. p. 78, 2015.
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., Theoretical study of the free water elimination model, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 2757, 2015.PDF icon Download abstract (594.47 KB)
B. Jeurissen, Tournier, J. - D., and Sijbers, J., Tissue-type segmentation using non-negative matrix factorization of multi-shell diffusion-weighted MRI images, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 349, 2015.PDF icon Download abstract (1.11 MB)
Conference Paper
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., 3D imaging of semiconductor components by discrete laminography, in Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings, 2014, vol. 1601, pp. 168-179.PDF icon Download paper (1.81 MB)
Conference Abstract
G. Van Eyndhoven, Batenburg, K. J., and Sijbers, J., Accurate reconstruction of porous samples in CT, International Conference on Industrial Computed Tomography (ICT). 2014.

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