Jan De Beenhouwer

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B
C. Bossuyt, den Dekker, A. J., Iuso, D., De Beenhouwer, J., and Sijbers, J., “Framework for optimal design of a multi-source rectangular X-ray cargo scanning system”, Radiation Physics and Chemistry, vol. 239, p. 113332, 2026.PDF icon Download paper (2.13 MB)
F
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
M
J. Merckx, den Dekker, A. J., Sijbers, J., and De Beenhouwer, J., “DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements”, IEEE Transactions on Computational Imaging , vol. 11, pp. 926 - 941, 2025.
Y
M. Yosifov, Lang, T., Florian, V., Gerth, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Degradation Detection in Rice Products via Shape Variations in XCT Simulation-Empowered AI”, Journal of Nondestructive Evaluation, vol. 44, no. 10, 2025.
F
N. Francken, “Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions”, 2025.
H
B. Huyge, Francken, N., Sanctorum, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “Edge illumination X-ray phase contrast imaging with continuous mask motion”, Optics Express, vol. 33, no. 19, pp. 41271-41286, 2025.PDF icon Download paper (4.78 MB)
F
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.
V
P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.
D
J. Deng, Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Chai, Y. Chin, Torfs, T., Braeken, D., De Beenhouwer, J., and Sijbers, J., “In-depth imaging of in-vitro tissue models using electrical impedance tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography, 2025, vol. 4 - 7 February.
H
Y. Huybrechts, De Ridder, R., Bergen, D., De Samber, B., Boudin, E., Tonelli, F., Knapen, D., Vergauwen, L., Schepers, D., Van Dijck, E., Tong, Q., Verhulst, A., De Beenhouwer, J., Sijbers, J., Hammond, C., Forlino, A., Mortier, G., Coucke, P., P Witten, E., Kwon, R. Young, Willaert, A., Hendrickx, G., and Van Hul, W., “Loss of the Ubiquitin-Associated Domain of sqstm1/p62 in Zebrafish Causes a Phenotype Resembling Paget’s Disease of Bone”, Calcified Tissue International, vol. 116, no. 1, pp. 1-15, 2025.
S
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings”, Journal of Applied Physics, vol. 137, no. 10, p. 104904, 2025.
D
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)
L
H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., “Proximal Neural Networks based reconstruction for few-view CT applications”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (4.27 MB)
Y
M. Yosifov, Fröhler, B., Sijbers, J., De Beenhouwer, J., Kastner, J., and Heinzl, C., “Superimposing Synthetic Defects into Real XCT Data and Segmentation-Based Comparison for Advanced Probability of Detection Evaluation”, Journal of Nondestructive Evaluation , vol. 44, no. 119, 2025.
V
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
L
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “About rapid phase-wrapping in terahertz phase contrast imaging”, in SPIE, 2024, vol. 13141, pp. 69-73.
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “AdAPTS: An Adaptive Atom Probe Tomography Simulation Library”, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
P
P. Paramonov, Francken, N., Renders, J., Iuso, D., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox”, Optics Express, vol. 32, no. 3, pp. 3425-3439, 2024.PDF icon Download paper (11.29 MB)
L
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Coherent detection terahertz imaging with a continuous wave source”, in SPIE, 2024, vol. 13141, pp. 63-68.
B
C. Bossuyt, den Dekker, A. J., Iuso, D., Le Hoang, T., Escoda, J., Costin, M., Sijbers, J., and De Beenhouwer, J., “Deep image prior for sparse-view reconstruction in static, rectangular multi-source x-ray CT systems for cargo scanning”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
R
J. Renders, Mancini, L., De Beenhouwer, J., and Sijbers, J., “Direct reconstruction of wet foam from sparse-view, dynamic X-ray CT scans”, Advanced Engineering Materials, vol. 2400957, pp. 1-10, 2024.PDF icon Download paper (2.77 MB)
K
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
F
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox”, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
I
D. Iuso, “Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection”, 2024.PDF icon Download thesis (31.17 MB)
M
J. Merckx, den Dekker, A. J., De Beenhouwer, J., and Sijbers, J., “Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA”, in SPIE Developments in X-Ray Tomography XV, San Diego, USA, 2024, vol. 13152.

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