Domenico Iuso

Domenico Iuso's picture



Vision Lab, Department of Physics
University of Antwerp (CDE)
Universiteitsplein 1 (N1.18)
2610 Wilrijk, Belgium

+32 (0) 3 265 24 77
+39 320 9572 156



Domenico Iuso is a doctoral researcher for the enhancement of CT images in industrial applications; his current research is about the development of X-ray scatter compensation techniques and CT reconstructions in distributed systems for optimal performances. As a side activity, Domenico is currently developing Deep Learning techniques for the identification of defects within Additive Manufactured parts.

In July 2020 Visionlab has welcomed Domenico in its research group for industrial CT and for the use of prior knowledge for the enhancement of CT images. Domenico has brought to the Visionlab the experiences of his R&D activity as an engineer in a biomedical company of Bologna (Italy) and as a researcher in X-ray scattered radiation at the University of Magdeburg (Germany).

Prior to these R&D activities, in 2016 Domenico received a Master of Science (MSc) degree with honours in Biomedical Engineering at "La Sapienza" University of Rome. The research activity of his MSc was about the development a software for particle backtracking as a plug-in for a fast Monte-Carlo TPS for particle therapy. In carbon beam treatments the emission profile of secondary charged particles is related to the profile of the delivered dose. His software processes the information of an external particle detector to back-trace the charged secondary particles to guarantee that the planned treatment is proceeding flawlessly.


  • Discrete and polychromatic CT reconstructions
  • Scatter compensation for CT 
  • Voxel-wise defect identification though Deep learning
  • Efficient GPU Programming in distributed systems


Teaching activities: 

2021-2022 Master course: Reconstruction techniques in medical imaging
2021-2022 Master course: X-ray microtomography
2022-2023 Master course: Reconstruction techniques in medical imaging
2022-2023 Master course: X-ray microtomography