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Atom column detection from simultaneously acquired ABF and ADF STEM images
Publication Type:
Journal Article
Authors:
Fatermans, J.
;
Arnold Jan den Dekker
;
Müller-Caspary, K.
;
N Gauquelin
;
Jo Verbeeck
;
Sandra Van Aert
Source:
Ultramicroscopy, Volume 219, p.113046 (2020)
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Research area:
Electron Microscopy