Atom column detection from simultaneously acquired ABF and ADF STEM images

Publication Type:

Journal Article

Authors:

Fatermans, J.; Arnold Jan den Dekker; Müller-Caspary, K.; N Gauquelin; Jo Verbeeck; Sandra Van Aert

Source:

Ultramicroscopy, Volume 219, p.113046 (2020)
Research area: 
Electron Microscopy