Publications

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In Press
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
2018
P. Scheunders, Tuia, D., and Moser, G., Contributions of Machine Learning to Remote Sensing Data Analysis, in Comprehensive Remote Sensing, vol. 2, 2018, pp. 199-243.
G. Van Eyndhoven and Sijbers, J., Iterative reconstruction methods in X-ray CT, in Handbook of X-ray Imaging: Physics and Technology, CRC Press, 2018, pp. 693-712.
2016
J. Veraart and Sijbers, J., Diffusion Kurtosis Imaging, in Diffusion Tensor Imaging: a practical handbook, New York: Springer-Verlag, 2016, pp. 407-418.
2012
P. Scheunders, Duijster, A., and Zhang, Y., Wavelet-based Multi/Hyperspectral Image Restoration and Fusion, in Signal and Image Processing for Remote Sensing, C. H. Chen, Ed. Taylor and Francis, 2012, pp. 505-523.
2005
A. J. den Dekker and Sijbers, J., Advanced Image Processing in Magnetic Resonance Imaging, in Series: Signal Processing and Communications, vol. 27, L. Landini, Ed. Marcel Dekker, 2005, pp. 85-143.
1997
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., Resolving atoms: what do we have? what do we want?, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.