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Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images
Publication Type:
Book Chapter
Authors:
Annick De Backer
;
Jarmo Fatermans
;
Arnold Jan den Dekker
;
Sandra Van Aert
Source:
Advances in Imaging and Electron Physics, Science Direct Elsevier, Volume 217 (2021)
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Research area:
Electron Microscopy