Atom column detection from STEM images using the maximum a posteriori probability rule

TitleAtom column detection from STEM images using the maximum a posteriori probability rule
Publication TypeConference Abstract
Year of Publication2019
AuthorsFatermans, J., A J. den Dekker, C. M. O'Leary, P. D. Nellist, and S. Van Aert
Conference NameMC 2019, Berlin, Germany
Research area: