Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question

Publication Type:

Journal Article

Authors:

Julie Gonnissen; Annick De Backer; Arnold Jan den Dekker; Jan Sijbers; Sandra Van Aert

Source:

Ultramicroscopy, Volume 147, p.112–120 (2017)
Research area: 
Electron Microscopy