Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

TitleBayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Publication TypeConference Abstract
Year of Publication2018
AuthorsJ. Fatermans, A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert
Conference NameSCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark
Research area: