Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

Publication Type:

Conference Abstract

Authors:

J Fatermans; Arnold Jan den Dekker; Müller-Caspary, K; Ivan Lobato; Sandra Van Aert

Source:

SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, p.95 (2018)
Research area: 
Electron Microscopy