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Detection of atomic columns from noisy STEM images
Publication Type:
Conference Abstract
Authors:
J Fatermans
;
Müller-Caspary, K
;
Arnold Jan den Dekker
;
Sandra Van Aert
Source:
Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, p.445-446 (2017)
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Research area:
Electron Microscopy