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A framework for markerless alignment with full 3D flexibility
Publication Type:
Conference Abstract
Authors:
Jan De Beenhouwer
;
Willem Jan Palenstijn
;
Folkert Bleichrodt
;
Kees Joost Batenburg
;
Jan Sijbers
Source:
European Microscopy Conference (2012)
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Files:
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Research area:
Electron Microscopy