The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images

TitleThe maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Publication TypeConference Abstract
Year of Publication2018
AuthorsFatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert
Conference NameIMC19, Sydney, Australia
Research area: